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Quality check for N95 masks
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Material characterization
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RIE- Oxygen-Argon Plasma
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Scanning Tunneling Microscope
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SEM (EVO 18)
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SF-100 Xpress Photolithography
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Sputtering
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Thermal and Thermal vapor deposition
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Thickness analyser
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UV- Visible spectrophotometer
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XRD
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Zeta- DLS
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